Composite/laser scanning probe
| LS20+ | LS30+ | LS50+ | LS60+ | ||
| Laser category | Semiconductor laser (405nm) | ||||
| laser power | < 2mW, Class II | ||||
| Measurement distance (mm) near/medium/far | 100 | 100 | 95 | 90 | |
| 112 | 116 | 125 | 125 | ||
| 125 | 135 | 165 | 175 | ||
| Measure depth of field (mm) | 25 | 35 | 70 | 85 | |
| SCAN WIDTH (mm) near/medium/far | 20 | 30 | 50 | 60 | |
| 22 | 32 | 58 | 72 | ||
| 24 | 35 | 70 | 86 | ||
| Sampling density (Minimum sampling interval) | 30 μm | 42 μm | 75 μm | 100 μm | |
| Sampling points | 768 points per line | ||||
| Sampling rate | 12000 points per second | ||||
| Measuring head size | 155×122×51mm | ||||
| Weight of measuring head | 330g | 345g | |||
| measurement accuracy | 12 μm | 15 μm | 30 μm | 40 μm | |
| Interface compatibility | PH10T, PH10M, non | ||||
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